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Test and Design-for-Test at
Design, Automation & Test in Europe
(DATE'12)

March 12-16, 2012
Dresden, Germany

http://www.eventURL.com

CALL FOR PAPERS
Scope -- Submissions -- Submission Instructions -- Key Dates -- Additional Information

Scope

The Design, Automation & Test in Europe Conference and Exhibition is the main European event bringing together designers and design automation users, researchers and vendors, as well as specialists in hardware and software design, test and manufacturing of electronic circuits and systems. The five-day event includes plenary invited papers, regular papers, panels, hot-topic sessions, tutorials and workshops, two special focus days, and a track for executives. DATE, with its many user group meetings, fringe meetings, and social events, offers a wide variety of opportunities to meet and exchange information.

Submissions on Test and Design-for-Test

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Test and Design-for-Test (DfT) in the broad sense are important topics and integral part of DATE, which is technically co-sponsored by the Test Technology Technical Council (TTTC). One of the parallel conference tracks is devoted to Test, and also tutorials, exhibition booths, and workshops cover Test and DfT. You are invited to participate in DATE’12 and send in one or more submissions of the following types.

Paper Submissions

  • Topic T1: Test for Defects, Variability, and Reliability
    Chairs: Sandip Kundu, Massachusetts University (USA); Bram Kruseman, NXP Semiconductors (NL)
    Defects and degradation mechanisms; physical sources of errors, incl. physical defects, signal integrity problems, PVT variations, and circuit reliability issues; design and test for robustness against PVT variations and circuit reliability.
  • Topic T2: Test Generation, Simulation, and Diagnosis
    Chairs: Nicola Nicolici, McMaster University (CAN); Grzegorz Mrugalski, Mentor Graphics (PL)
    Test pattern generation; high-level TPG; delay TPG; fault simulation; test generation for validation, debug and diagnosis; low-power TPG; TPG for memories and FPGAs.
  • Topic T3: Test for Mixed-Signal, Analog, RF, and MEMS
    Chairs: Hans Kerkhoff, University of Twente (NL); Abhijit Chatterjee, Georgia Institute of Technology (USA)
    Test, diagnosis, and tuning techniques for MS systems, MEMS, RF; defect modeling, test coverage metrics, statistical modeling, fault simulation, test generation, DfX techniques, BIST and BISR.
  • Topic T4: Test Access, Design-for-Test, Test Compression, System Test
    Chairs: Sybille Hellebrand, Paderborn University (D); Rohit Kapur, Synopsys (USA)
    DfT for SOCs, SIPs, NOCs, and 3D-ICs; built-in and embedded test and diagnosis; test data compression, low-power DfT and BIST; design-for-debug, diagnosis, and manufacturability; system-level test.
  • Topic T5: On-Line Testing and Fault Tolerance
    Chairs: Cecilia Metra, Università di Bologna (IT); Lorena Anghel, TIMA (FR)
    On-line and concurrent testing and diagnosis; fault tolerance; dependability; security; robust design.

Proposals for Special Sessions – Chair: Andreas Herkersdorf, TU Munich (D)
Special Sessions can take various forms:

  • Embedded Tutorials, providing technical education sessions for a broad audience,
  • Hot-Topic Sessions, dealing with the introduction and discussion of new R&D problems,
  • Panels, discussing visionary and/or controversial issues.

Proposals for Full-Day or Half-Day Tutorials– Chair: Luca Fanucci, Università di Pisa (IT)
Tutorials are relevant and topical educational sessions, taught by leading experts.

Proposals for University Booth Presentations– Chairs: Jens Lienig, IFTE (D); Andreas Vörg, edaCentrum (D)
Universities and research institutes can showcase their pre-commercial results and prototype demos.

Proposals for Presentations at the Exhibition Theatre– Chair: Jürgen Haase, edaCentrum (D)
The Exhibition Theatre offers an open discussion forum at DATE’s exhibition, including panel sessions and customer testimonials.

Proposals for Full-Day Workshops – Chair: Nicola Nicolici, McMaster University (CAN); Lorena Anghel, TIMA (F)
On Friday, DATE hosts a number of parallel workshops on emerging research and application topics.

Proposals for Fringe Meetings – Contact: Claire Cartwright, European Conferences (UK)
A limited number of rooms is available for related open and closed meetings.

Submissions

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Submission instructions for the various types of submissions are specified at:

http://www.date-conference.com

Key Dates

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Submission deadline: September 2, 2011 (workshops)
Submission deadline: September 11, 2011 (papers, special sessions, tutorials)
Submission deadline: October 24, 2011 (exhibition theatre)
Notification of acceptance: November 14, 2011
Camera-ready manuscripts: December 12, 2011

Submission deadline: January 16, 2012 (university booth proposals)

Additional Information
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Erik Jan Marinissen – Test Track Chair
IMEC, Leuven, Belgium
e-mail: erik.jan.marinissen@imec.be

Lothar Thiele – Program Chair
ETH Zurich, Switzerland
e-mail: thiele@tik.ee.ethz.ch

Wolfgang Rosenstiel – General Chair
Univ. of Tübingen, Germany
e-mail: rosenstiel@informatik.uni-tuebingen.de

Committees
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TBA

For more information, visit us on the web at: http://www.date-conference.com

The Design, Automation & Test in Europe (DATE'12 ) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).


IEEE Computer Society- Test Technology Technical Council

TTTC CHAIR
Adit D. SINGH
Auburn University - USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

PAST CHAIR
André IVANOV
University of British Columbia - Canada
Tel. +1-604-822-6936
E-mail ivanov@ece.ubc.ca

TTTC 1ST VICE CHAIR
Michael NICOLAIDIS
TIMA Laboratory - France
Tel. +33-4-765-74696
E-mail michael.nicolaidis@imag.fr

SECRETARY
Joan FIGUERAS
UPC Barcelona Tech - Spain
Tel. +
E-mail figueras@eel.upc.edu

ITC GENERAL CHAIR
Doug YOUNG
- USA
Tel. +1-602-617-0393
E-mail doug0037@aol.com

TEST WEEK COORDINATOR
Yervant ZORIAN
Synopsys, Inc.- USA
Tel. +1-650-584-7120
E-mail Yervant.Zorian@synopsys.com

TUTORIALS AND EDUCATION
Dimitris GIZOPOULOS

University of Athens
- Greece
Tel. +30-210-7275145
E-mail dgizop@di.uoa.gr

STANDARDS
Rohit KAPUR

Synopsys
, Inc. - USA
Tel. +1-650-934-1487
E-mail rkapur@synopsys.com

EUROPE
Matteo SONZA REORDA
Politecnico di Torino - Italy
Tel.+39-011-564-7055
E-mail matteo.sonzareorda@polito.it

MIDDLE EAST & AFRICA
Ibrahim HAJJ
American University of Beirut - Lebanon
Tel. +961-1-341-952
E-mail ihajj@aub.edu.lb

STANDING COMMITTEES
André IVANOV
University of British Columbia - Canada
Tel. +1-604-822-6936
E-mail ivanov@ece.ubc.ca

ELECTRONIC MEDIA
Alfredo BENSO
Politecnico di Torino - Italy
Tel. +39-011-564-7080
E-mail alfredo.benso@polito.it

 

PRESIDENT OF BOARD
Yervant ZORIAN
Synopsys, Inc.- USA
Tel. +1-650-584-7120
E-mail Yervant.Zorian@synopsys.com

SENIOR PAST CHAIR
Paolo PRINETTO
Politecnico di Torino - Italy
Tel. +39-011-564-7007
E-mail Paolo.Prinetto@polito.it

TTTC 2ND VICE CHAIR
Chen-Huan CHIANG

Alcatel-Lucent
- USA
Tel. +1-973-386-6759
E-mail chen-huan.chiang@alcatel-lucent.com

FINANCE
Michael NICOLAIDIS
TIMA Laboratory - France
Tel. +33-4-765-74696
E-mail michael.nicolaidis@imag.fr

IEEE DESIGN & TEST EIC
Krish CHAKRABARTY
Duke University - USA
Tel. +1-
E-mail krish@ee.duke.edu

TECHNICAL MEETINGS
Chen-Huan CHIANG
Alcatel-Lucent
- USA
Tel. +1-973-386-6759
E-mail chen-huan.chiang@alcatel-lucent.com

TECHNICAL ACTIVITIES
Patrick GIRARD
LIRMM – France
Tel.+33 467 418 629
E-mail patrick.girard@lirmm.fr

ASIA & PACIFIC
Kazumi HATAYAMA
NAIST - Japan
Tel. +81 743 72 5221
E-mail k-hatayama@is.naist.jp

LATIN AMERICA
Victor Hugo CHAMPAC
Instituto Nacional de Astrofisica - Mexico
Tel.+52-22-470-517
E-mail champac@inaoep.mx

NORTH AMERICA
André IVANOV
University of British Columbia - Canada
Tel. +1-604-822-6936
E-mail ivanov@ece.ubc.ca

COMMUNICATIONS
Cecilia METRA
Università di Bologna - Italy
Tel. +39-051-209-3038
E-mail cmetra@deis.unibo.it

INDUSTRY ADVISORY BOARD
Yervant ZORIAN
Synopsys, Inc.- USA
Tel. +1-650-584-7120
E-mail Yervant.Zorian@synopsys.com